Identification of the oxygen-vacancy defect containing a single hydrogen atom in crystalline silicon

Physical Review B - Condensed Matter and Materials Physics

Volumn 61, Issue 7, 2000, Pages 4659-4666

  Johannesen, P ^a   Nielsen, B Bech ^a   Byberg, J ^a  

^a AARHUS UNIVERSITY   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001054368     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.61.4659     Document Type: Article

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