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Volumn 17, Issue 6, 1999, Pages 3362-3367
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X-ray photoelectron spectroscopy studies of modified surfaces of α-Al2O3, SiO2, and Si3N4 by low energy reactive ion beam irradiation
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001035653
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.582067 Document Type: Article |
Times cited : (13)
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References (19)
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