메뉴 건너뛰기




Volumn 37, Issue 19, 1998, Pages 4254-4259

Attenuated phase-shifting masks of chromium aluminum oxide

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001022708     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.004254     Document Type: Article
Times cited : (12)

References (20)
  • 3
    • 0010288849 scopus 로고
    • Thin film materials for the preparation of attenuating phase shift masks
    • K. K. Shih and D. B. Dove, “Thin film materials for the preparation of attenuating phase shift masks, ” J. Vac. Sci. Technol. B 12, 32-36 (1994).
    • (1994) J. Vac. Sci. Technol. B , vol.12 , pp. 32-36
    • Shih, K.K.1    Dove, D.B.2
  • 4
    • 0342307330 scopus 로고
    • Required optical characteristics of materials for phase-shifting masks
    • C. Pierrat and S. Vaidya, “Required optical characteristics of materials for phase-shifting masks, ” Appl. Opt. 34, 4923-4928 (1995).
    • (1995) Appl. Opt. , vol.34 , pp. 4923-4928
    • Pierrat, C.1    Vaidya, S.2
  • 6
    • 0343176801 scopus 로고
    • Optimization of the optical phase shift in attenuated PSM and application to quarter micrometer deep-UV lithography for logics
    • T. A. Brunner, ed., Proc. SPIE2197
    • K. Ronse, R. Pforr, K.-H. Baik, R. Jonckheere, and L. Ban den hove, “Optimization of the optical phase shift in attenuated PSM and application to quarter micrometer deep-UV lithography for logics, ” in Optical/Laser Microlithography VII, T. A. Brunner, ed., Proc. SPIE2197, 86-98 (1994).
    • (1994) Optical/Laser Microlithography VII , pp. 86-98
    • Ronse, K.1    Pforr, R.2    Baik, K.-H.3    Jonckheere, R.4    Ban Den Hove, L.5
  • 9
    • 0342313530 scopus 로고
    • Development and evaluation of chromium-based attenuated phase shift masks for DUV exposure
    • H. Yoshihara, ed., Proc. SPIE2512
    • K. Mikami, H. Mohri, H. Miyashita, N. Hayashi, and H. Sano, “Development and evaluation of chromium-based attenuated phase shift masks for DUV exposure, ” in Photomask and X-Ray Mask Technology II, H. Yoshihara, ed., Proc. SPIE 2512, 333-342 (1995).
    • (1995) Photomask and X-Ray Mask Technology II , pp. 333-342
    • Mikami, K.1    Mohri, H.2    Miyashita, H.3    Hayashi, N.4    Sano, H.5
  • 12
    • 0027889038 scopus 로고
    • Monolayer halftone phase-shifting mask for KrF excimer laser lithography
    • Y. Iwabuchi, J. Ushioda, H. Tanabe, Y. Ogura, and S. Kishida, “Monolayer halftone phase-shifting mask for KrF excimer laser lithography, ” Jpn. J. Appl. Phys. 32, Part 1 (12B), 5900-5902 (1993).
    • (1993) Jpn. J. Appl. Phys. , vol.32 , Issue.12 , pp. 5900-5902
    • Iwabuchi, Y.1    Ushioda, J.2    Tanabe, H.3    Ogura, Y.4    Kishida, S.5
  • 13
    • 6144229177 scopus 로고
    • Development of the W/Si film for the single-layered attenuated phase shifting mask for 248-nm lithography
    • H. Yoshihara, ed., Proc. SPIE2512
    • H. Mitsui, H. Sakai, and Y. Yamaguchi, “Development of the W/Si film for the single-layered attenuated phase shifting mask for 248-nm lithography, ” in Photomask and X-Ray Mask Technology II, H. Yoshihara, ed., Proc. SPIE 2512, 343-347 (1995).
    • (1995) Photomask and X-Ray Mask Technology II , pp. 343-347
    • Mitsui, H.1    Sakai, H.2    Yamaguchi, Y.3
  • 18
    • 18844415430 scopus 로고    scopus 로고
    • ArF excimer laser exposure durability of chromium fluoride attenuated phase-shift masks
    • (Society of Photo-Optical Instrumentation Engineers, Bellingham, Wash
    • Y. Seki, J. Ushioda, T. Saito, K. Maeda, K. Nakano, S. Iwasa, T. Ohfuji, and H. Tanabe, “ArF excimer laser exposure durability of chromium fluoride attenuated phase-shift masks, ” in Digest of Abstracts, Photomask Japan '97 (Society of Photo-Optical Instrumentation Engineers, Bellingham, Wash., 1997), pp. 94-95.
    • (1997) Digest of Abstracts, Photomask Japan '97 , pp. 94-95
    • Seki, Y.1    Ushioda, J.2    Saito, T.3    Maeda, K.4    Nakano, K.5    Iwasa, S.6    Ohfuji, T.7    Tanabe, H.8
  • 20
    • 0010817303 scopus 로고    scopus 로고
    • Effects of gas ring position and mesh introduction on film quality and thickness uniformity
    • S. Hong, E. Kim, Z.-T. Jiang, K. No, S.-C. Lim, S.-G. Woo, and Y.-B. Koh, “Effects of gas ring position and mesh introduction on film quality and thickness uniformity, ” Mater. Sci. Eng. B 45, iss 1-3, 98-101 (1997).
    • (1997) Mater. Sci. Eng. B45 , vol.1 , Issue.3 , pp. 98-101
    • Hong, S.1    Kim, E.2    Jiang, Z.-T.3    No, K.4    Lim, S.-C.5    Woo, S.-G.6    Koh, Y.-B.7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.