Nanometer scale surface clustering on ZnSe epilayers

Applied Physics Letters

Volumn 72, Issue 10, 1998, Pages 1238-1240

  Smathers, J B ^a   Kneedler, E ^a   Bennett, B R ^a   Jonker, B T ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000945907     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121025     Document Type: Article

References (23)

1. M. C. Tamargo, J. L. de Miguel, D. M. Hwang, and H. H. Farrell, J. Vac. Sci. Technol. B 6, 784 (1988).
2. G. Bratina, T. Ozzello, and A. Franciosi, J. Vac. Sci. Technol. A 14, 3135 (1996).
3. J. M. Gaines, J. Pertruzello, and B. Greenberg, J. Appl. Phys. 73, 2835 (1993).
4. S. Guha, H. Munekata, and L. L. Chang, J. Appl. Phys. 73, 2294 (1993).
5. P. Ruppert, D. Hommel, T. Heinke, A. Waag, and G. Lanwehr, J. Cryst. Growth 138, 48 (1994).
6. Y. Qiu, A. Osinsky, A. A. El-Emawy, E. Littlefield, and H. Temkin, J. Appl. Phys. 79, 1164 (1996).
7. M. D. Pashley and D. Li, Mater. Sci. Eng. B 30, 73 (1995).
8. M. Funato, S. Aoki, S. Fujita, and S. Fujita, Jpn. J. Appl. Phys., Part 2 36, L4 (1997).
9. J. A. Warren and B. T. Murray, Model. Simul. Mater. Sci. 4, 215 (1996).
10. R. J. Barel, G. R. Carlow, M. Zinke-Allmang, Y. Wu, and T. Lookman, Physica A 239, 53 (1996).
11. W. Seifert, N. Carlson, M. Miller, M. Pistol, L. Samuelson, and L. R. Wallenberg, Prog. Cryst. Growth Charact. 33, 423 (1996).
12. R. Notzel, Semicond. Sci. Technol. 11, 1365 (1996).
13. I. N. Stranski and L. Krastanow, Sitz.Ber.Akad.Wiss., Math.-naturwiss. Kl.Abt.IIb 146, 797 (1938).
14. A. G. Cullis, A. T. Pidduck, and M. T. Emeny, Inst. Phys. Conf. Ser. 146, 163 (1995).
15. M. Arita, A. Avramescu, K. Uesugi, I. Suemune, T. Numai, H. Machida, and N. Shimoyama, Jpn. J. Appl. Phys., Part 1 36, 4097 (1996).
16. S. H. Xin, P. D. Wang, Y. Aie, C. Kim, M. Dobrowolska, J. L. Merz, and J. K. Furdyna, Appl. Phys. Lett. 69, 3884 (1996).
17. Sample provided by G. A. Prinz of the Naval Research Laboratory.
18. Sample provided by H. Luo of the State University of New York (SUNY) at Buffalo.
19. R. Ludeke, Solid State Commun. 24, 725 (1977).
20. A. Ebina, K. Asano, Y. Suda, and T. Takahaski, J. Vac. Sci. Technol. 17, 1074 (1980).
21. A. Ebina, Y. Suda, and T. Takahashi, Int. J. Electron. 52, 77 (1982).
22. O. Kubaschewski and C. B. Alock, Metallurgical Thermochemistry, 5th ed. (Pergamon, New York, 1979).
23. M. M. Montecchi and M. P. da Silva, Thin Solid Films 234, 557 (1993).