Residual strain dependence of optical characteristics in GaN layers grown on (0001) sapphire substrates

Applied Physics Letters

Volumn 75, Issue 8, 1999, Pages 1137-1139

  Funato, Kenji ^a   Hashimoto, Shigeki ^a   Yanashima, Katsunori ^a   Nakamura, Fumihiko ^a   Ikeda, Masao ^a  

^a SONY CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000931271     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124621     Document Type: Article

References (16)

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