Tunneling current and surface potential simultaneous measurement using a scanning probe

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 37, Issue 8, 1998, Pages 4557-4560

  Majima, Yutaka ^a   Miyamoto, Shin Ichiro ^a   Oyama, Yutaka ^a   Iwamoto, Mitsumasa ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Displacement current; Kelvin method; Scanning probe; Scanning tunneling spectroscopy; Tunneling current

Indexed keywords

CAPACITANCE; ELECTRIC POTENTIAL; ELECTRON TUNNELING; SCANNING; SKIN EFFECT; TUNGSTEN;

SURFACE POTENTIALS; TUNNELING CURRENTS;

SURFACE MEASUREMENT;

EID: 0032131330     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.4557     Document Type: Article

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