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Volumn 54, Issue 1-3, 1996, Pages 477-481

Self-excited force-sensing microcantilevers with piezoelectric thin films for dynamic scanning force microscopy

Author keywords

Dynamic operation mode; Piezoelectric microcantilevers; Scanning force microscopy; Self excitation; Static displacement

Indexed keywords


EID: 0001146439     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(97)80007-6     Document Type: Article
Times cited : (43)

References (10)
  • 1
    • 0027679006 scopus 로고
    • Development of a force sensor for atomic force microscopy using piezoelectric thin films
    • T. Itoh and T. Suga, Development of a force sensor for atomic force microscopy using piezoelectric thin films, Nanotechnology, 4 (1993) 218-224.
    • (1993) Nanotechnology , vol.4 , pp. 218-224
    • Itoh, T.1    Suga, T.2
  • 2
    • 0000604383 scopus 로고
    • Scanning force microscope using a piezoelectric microcantilever
    • T. Itoh and T. Suga, Scanning force microscope using a piezoelectric microcantilever, J. Vac. Sci. Technol. B, 12 (1994) 1581-1585.
    • (1994) J. Vac. Sci. Technol. B , vol.12 , pp. 1581-1585
    • Itoh, T.1    Suga, T.2
  • 4
    • 0029252267 scopus 로고
    • Scanning force microscope using piezoelectric excitation and detection
    • T. Itoh, T. Ohashi and T. Suga, Scanning force microscope using piezoelectric excitation and detection, IEICE Trans. Electron, E78-C (1995) 146-151.
    • (1995) IEICE Trans. Electron , vol.E78-C , pp. 146-151
    • Itoh, T.1    Ohashi, T.2    Suga, T.3
  • 6
    • 21544472129 scopus 로고
    • Atomic resolution with an atomic force microscope using piezoresistive detection
    • M. Tortonese, R.C. Barrett and C.F. Quate, Atomic resolution with an atomic force microscope using piezoresistive detection, Appl Phys. Lett., 62 (1993) 834-836.
    • (1993) Appl Phys. Lett. , vol.62 , pp. 834-836
    • Tortonese, M.1    Barrett, R.C.2    Quate, C.F.3
  • 7
    • 0001315490 scopus 로고
    • Atomic force microscopy using ZnO whisker tip
    • H. Kado, K. Yokoyama and T. Tohda, Atomic force microscopy using ZnO whisker tip, Rev. Sci. Instrum., 63 (1992) 3330-3332.
    • (1992) Rev. Sci. Instrum. , vol.63 , pp. 3330-3332
    • Kado, H.1    Yokoyama, K.2    Tohda, T.3
  • 8
    • 30244464959 scopus 로고
    • Maruzen, Tokyo, (in Japanese)
    • Tokyo Astronomical Observatory (ed.), Rika-nenpyo (Scientific Tables), Maruzen, Tokyo, 1984, pp. 431-450 (in Japanese).
    • (1984) Rika-nenpyo (Scientific Tables) , pp. 431-450
  • 9
    • 0020127035 scopus 로고
    • Silicon as a mechanical material
    • K.E. Petersen, Silicon as a mechanical material, Proc. IEEE, 70 (1982) 420-457.
    • (1982) Proc. IEEE , vol.70 , pp. 420-457
    • Petersen, K.E.1
  • 10
    • 0013273203 scopus 로고
    • ZnO piezoelectric thin film and its application
    • in Japanese
    • N. Chubachi, ZnO piezoelectric thin film and its application, Oyo Buturi, 48 (1977) 663-676 (in Japanese).
    • (1977) Oyo Buturi , vol.48 , pp. 663-676
    • Chubachi, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.