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Volumn 9, Issue 1, 1997, Pages 349-362

Comparison of Pulsed and Continuous-Wave Deposition of Thin Films from Saturated Fluorocarbon/H2 Inductively Coupled rf Plasmas

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EID: 0000810447     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm960388q     Document Type: Article
Times cited : (134)

References (62)
  • 35
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    • note
    • This is true for the deposition conditions given in the experimental methods.
  • 36
    • 0024030509 scopus 로고
    • Previous FTIR studies have demonstrated the presence of the bifluoride ion in similar systems. Haque, Y.; Ratner, B. D. J. Polym. Sci., Polym. Phys. 1988, 26, 1237-1249.
    • (1988) J. Polym. Sci., Polym. Phys. , vol.26 , pp. 1237-1249
    • Haque, Y.1    Ratner, B.D.2
  • 38
    • 0001620989 scopus 로고
    • Dischler, B. In Amorphous Hydrogenated Carbon Films, Koidl, P., Oelhafen, P., Eds.; Proc. E-MRS 1987, 17, 189-201.
    • (1987) Proc. E-MRS , vol.17 , pp. 189-201
  • 39
    • 0346746211 scopus 로고    scopus 로고
    • note
    • Because of the large variability in film thicknesses for the pulsed experiments, the FTIR spectra are shown with full scale absorption, rather than on the same absorption scale. Note that films deposited from pulsed plasmas are considerably thinner than those deposited in the CW systems.
  • 40
    • 0003650305 scopus 로고
    • Allyn & Bacon: Boston
    • Conley, R. T. In Infrared Spectroscopy; Allyn & Bacon: Boston, 1966; Mukherjee, S. P.; Evans. P. E. Thin Solid Films 1972, 14, 105.
    • (1966) Infrared Spectroscopy
    • Conley, R.T.1
  • 41
  • 44
    • 0001165107 scopus 로고
    • An alternate explanation for the presence of Si in our samples is silicone contamination. Si is not detected in the Washington XPS system on films deposited from other glass wall reactors unless the film is thinner than the XPS sampling depth. In those cases, the Si signal is from the underlying substrate. Castner, D. G.; Lewis, K. B., Jr.; Fischer, D. A.; Ratner, B. D.; Gland, J. L. Langmuir 1993, 9, 537-542.
    • (1993) Langmuir , vol.9 , pp. 537-542
    • Castner, D.G.1    Lewis Jr., K.B.2    Fischer, D.A.3    Ratner, B.D.4    Gland, J.L.5
  • 46
    • 85087579859 scopus 로고    scopus 로고
    • note
    • 4 systems, respectively.
  • 50
    • 0346746210 scopus 로고    scopus 로고
    • note
    • Other possible sources of the discrepancy may be reactor pressure, pumping speed, or monomer flow rate.
  • 56
    • 0346746208 scopus 로고    scopus 로고
    • note
    • Small amounts of hydrogen are incorporated under certain pulsed conditions. Our FTIR and XPS results, however, indicate that this is negligible under the optimum pulsed conditions.
  • 57
    • 0346115623 scopus 로고    scopus 로고
    • note
    • These measurements were performed using a Rudolf Research 2000FT ellipsometer taken at a wavelength of 632.8 nm.
  • 58
    • 0004038250 scopus 로고
    • Addison-Wesley: Reading, MA
    • Hecht E. Optics, 3rd ed.; Addison-Wesley: Reading, MA, 1987.
    • (1987) Optics, 3rd Ed.
    • Hecht, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.