Capacitance-voltage and admittance spectroscopy of self-assembled Ge islands in Si

Applied Physics Letters

Volumn 77, Issue 17, 2000, Pages 2704-2706

  Miesner, C ^a   Asperger, T ^a   Brunner, K ^a   Abstreiter, G ^a  

^a WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000757282     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1320036     Document Type: Article

References (14)

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