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Volumn 85, Issue 9, 1999, Pages 6828-6837

X-ray photoelectron spectra of low temperature plasma anodized Si0.84Ge0.16 alloy on Si(100): Implications for SiGe oxidation kinetics and oxide electrical properties

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000658076     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370201     Document Type: Article
Times cited : (28)

References (38)
  • 9
    • 85034543933 scopus 로고
    • T.U. Delft, The Netherlands
    • S. C. Jain and P. Balk, DIMES (T.U. Delft, The Netherlands, 1992).
    • (1992) DIMES
    • Jain, S.C.1    Balk, P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.