Y-Si(111) interface formation studied by scanning tunneling microscopy

Surface Science

Volumn 454, Issue 1, 2000, Pages 842-846

  Polop, C ^a   Sacedon J L ^a   Martin Gago J A ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

MONOLAYERS; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SURFACE ROUGHNESS; YTTRIUM;

CRYSTALLINE-AMORPHOUS INTERFACES;

INTERFACES (MATERIALS);

EID: 0033702170     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00237-5     Document Type: Article

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