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Volumn 58, Issue 16, 1998, Pages 10363-10377

Defects in electron-irradiated Si studied by positron-lifetime spectroscopy

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EID: 0000592917     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.58.10363     Document Type: Article
Times cited : (37)

References (43)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.