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Volumn 365, Issue 3, 1996, Pages 735-742
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Spatial distribution of in during the initial stages of growth of InAs on GaAs(001)-c(4 × 4)
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Author keywords
Adsorption kinetics; Atom solid reactions; Chemisorption; Epitaxy; Gallium arsenide; Growth; Indium arsenide; Molecular beam epitaxy; Quantum wells; Reflection high energy electron diffraction (RHEED); Scanning tunneling microscopy; Semiconducting films
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Indexed keywords
ADSORPTION;
CHEMISORPTION;
ELECTRONIC STRUCTURE;
EPITAXIAL GROWTH;
INTERFACES (MATERIALS);
MOLECULAR BEAM EPITAXY;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
SCANNING TUNNELING MICROSCOPY;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTING INDIUM COMPOUNDS;
SEMICONDUCTOR QUANTUM WELLS;
SURFACE STRUCTURE;
ATOM SOLID REACTIONS;
SEMICONDUCTING SURFACES;
SINGLE CRYSTAL SURFACES;
SPATIAL DISTRIBUTION;
SURFACE TOPOGRAPHY;
SEMICONDUCTOR GROWTH;
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EID: 0030271045
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/0039-6028(96)00757-1 Document Type: Article |
Times cited : (47)
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References (22)
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