Microstnjcture and electrical properties of some multicrystalline silicon billets continuously cast in a cold crucible

Solid State Phenomena

Volumn 51-52, Issue , 1996, Pages 473-478

  Perichaud I ^a   Dour, G ^b   Pillin, B ^c   Durand, F ^c   Sarti, D ^b   Martinuzzi, S ^a  

^a Fac des Sci et Techniques   (France)

^b Photowatt Int   (France)

^c UNIV GRENOBLE ALPES   (France)

Author keywords

Cold Crucible; Grain Boundaries; Intragrain Extended Defects; LBIC Mapping; Minority Carrier Diffusion Lengths; Precipitates

Indexed keywords

EID: 17544380638     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Article

References (5)

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5. J.J. Kang and D. K. Schroder, J. Appl. Phys. 65, 2974 (1989)