Determining Terminal-Pair Reliability Based on Edge Expansion Diagrams Using OBDD

IEEE Transactions on Reliability

Volumn 48, Issue 3, 1999, Pages 234-246

  Kuo, Sy Yen ^a,b   Lu, Shyue Kung ^a   Yefa, Fui Min ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^b FU JEN CATHOLIC UNIVERSITY   (Taiwan)

Author keywords

Boolean function; Factoring; Network reduction; Ordered binary decision diagram (obdd); Terminal pair reliability

Indexed keywords

EID: 0000483766     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.799845     Document Type: Article

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