SYREL: A Symbolic Reliability Algorithm Based on Path and Cutset Methods

IEEE Transactions on Computers

Volumn C-36, Issue 10, 1987, Pages 1224-1232

  Hariri, Salim ^a   Raghavendra, C S ^b  

^a DAMASCUS UNIVERSITY   (United States)

^b UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

Conditional probability; cutsets; path enumeration; reliability evaluation tool; terminal reliability

Indexed keywords

EID: 33646098092     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.1987.1676862     Document Type: Article

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