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Volumn C-27, Issue 6, 1978, Pages 509-516

Binary Decision Diagrams

Author keywords

[No Author keywords available]

Indexed keywords

LOGIC DEVICES;

EID: 0017983865     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.1978.1675141     Document Type: Article
Times cited : (1249)

References (8)
  • 5
    • 0015663187 scopus 로고
    • Universal test sets for logic networks
    • Sept.
    • S. B. Akers, “Universal test sets for logic networks,” IEEE Trans. Comput., vol. C-22, pp. 835–839, Sept. 1973.
    • (1973) IEEE Trans. Comput. , vol.C-22 , pp. 835-839
    • Akers, S.B.1
  • 6
    • 0015681902 scopus 로고
    • Complete test sets for logic functions
    • Nov.
    • S. M. Reddy, “Complete test sets for logic functions,” IEEE Trans. Comput., vol. C-22, pp. 1016–1020, Nov. 1973.
    • (1973) IEEE Trans. Comput. , vol.C-22 , pp. 1016-1020
    • Reddy, S.M.1
  • 7
    • 84937998861 scopus 로고
    • On finding a nearly minimal set of fault detection tests for combinational logic nets
    • Feb.
    • D. B. Armstrong, “On finding a nearly minimal set of fault detection tests for combinational logic nets,” IEEE Trans. Comput., vol. EC-15, pp. 66-73, Feb. 1966.
    • (1966) IEEE Trans. Comput. , vol.EC-15 , pp. 66-73
    • Armstrong, D.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.