Electronic structure of GaN stacking faults

Physical Review B - Condensed Matter and Materials Physics

Volumn 56, Issue 7, 1997, Pages 3564-3566

  Bandic Z ^a   McGill, T ^a   Ikonic Z ^b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b School of Electrical Engineering   (Serbia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000448939     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.56.3564     Document Type: Article

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