Epitaxial thin-film growth of C60 on VSe2 studied with scanning tunneling microscopy and x-ray diffraction

Physical Review B - Condensed Matter and Materials Physics

Volumn 59, Issue 20, 1999, Pages 13394-13400

  Schwedhelm, R ^a   Schlomka, J P ^a   Woedtke, S ^a   Adelung, R ^a   Kipp, L ^a   Tolan, M ^a   Press, W ^a   Skibowski, M ^a  

^a UNIVERSITY OF KIEL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000396040     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.13394     Document Type: Article

References (35)

1. H.W.Kroto, J. H.Heath, S.C.O’Brian, R. F.Curl, and R. E.Smalley, Letters to Nature, 318, 162(1985).
2. W.Krätschmer, L.D.Lamb, K.Fostiropoulos, and D.R.Huffmann, Nature (London), 347, 355(1990).
3. R.Schwedhelm, L.Kipp, A.Dallmeyer, and M.Skibowski, Phys. Rev. B, 58, 13176(1998).
4. X.D.Wang, T.Hashizume, and T.Sakurai, Mod. Phys. Lett. B, 8, 1597(1994).
5. K.R.Wirth and J.Zegenhagen, Phys. Rev. B, 56, 9864(1997).
6. Y.-R.Ma, P.Moriarty, and P.H.Beton, Phys. Rev. Lett, 78, 2588(1997).
7. A.W.Dunn, P.Moriarty, M.D.Upward, and P.H.Beton, Appl. Phys. Lett, 69, 506(1996).
8. X.Yao, T. G.Ruskell, R. K.Workman, D.David, and D.Chen, Surf. Sci, 366, L743(1996).
9. H.Xu, D.M.Chen, and W.N.Creager, Phys. Rev. Lett, 70, 1850(1993).
10. Q.Xue, Y.Ling, T.Ogino, T.Sakata, Y.Hasegawa, T.Hashizume, H.Shinohara, and T.Sakurai, Thin Solid Films, 281-282, 618(1996).
11. Y.Maruyama, K.Ohno, and Y.Kawazoe, Phys. Rev. B, 52, 2070(1995).
12. M.K.-J.Johansson, A. J.Maxwell, S. M.Gray, P. A.Brüwiler, D. G.Mancini, L. S. O.Johansson, and N.Mårtensson, Phys. Rev. B, 54, 13472(1996).
13. B.Reihl, in Science and Technology of Fullerene Materials, edited by P. Bernier, T.W. Ebbesen, D.S. Bethune, R. M. Metzger, L.Y. Chiang, and J.W. Mintmire, MRS Symposia Proceedings No. 359 (Materials Research Society, Pittsburgh, 1995), p. 379.
14. T.David, J. K.Gimzewski, D.Purdie, B.Reihl, and R. R.Schlitter, Phys. Rev. B, 50, 5810(1994).
15. J.K.Gimzewski, S.Modesti, and R.R.Schlittler, Phys. Rev. Lett, 72, 1036(1994).
16. Y.Kuk, D. K.Kim, Y. D.Suh, K. H.Park, H. P.Noh, S. J.Oh, and S. K.Kim, Phys. Rev. Lett, 70, 1948(1993).
17. T.Michely, M.Hohage, M.Bott, and G.Comsa, Phys. Rev. Lett, 70, 3943(1993).
18. P.W.Murray, M. Ø.Pedersen, E.Lœgsgaard, I.Stensgaard, and F.Besenbacher, Phys. Rev. B, 55, 9360(1997).
19. U.D.Schwarz, W.Allers, G.Gensterblum, J.-J.Pireaux, and R.Wiesendanger, Phys. Rev. B, 52, 5967(1995).
20. D.Zhao, T.Chen, and L.Wang, Appl. Phys. Lett, 66, 3292(1995).
21. Y.Z.Li, J.C.Patrin, M.Chander, J.H.Weaver, L.P.F.Chibante, and R.E.Smalley, Science, 252, 547(1991).
22. Q.Xue, Y.Ling, T.Ogino, T.Sakata, Y.Hasegawa, T.Hashizume, H.Shinohara, and T.Sakurai, Thin Solid Films, 281-282, 618(1996).
23. P. H.Dederichs, H.Schober, and D.Sellmeyer, in Phononenzustände, Elektronenzustände und Fermiflächen, edited by K.-H. Hellwege and J. L. Olsen, Landolt-Börnstein, New Series, Group III, Vol. 13, Pt. a (Springer-Verlag, Berlin, 1981).
24. T.A.Witten and L.M.Sander, Phys. Rev. B, 27, 5686(1983).
25. T.A.Witten Jr. and P.Meakin, Phys. Rev. B, 28, 5632(1983).
26. L.G.Parratt, Phys. Rev, 95, 359(1954).
27. J.Lekner, Theory of Reflection (Martinus Nijhoff Publishers, Dordrecht, 1987).
28. J.-P.Schlomka, M.Tolan, L.Schwalowsky, O. H.Seeck, J.Stettner, and W.Press, Phys. Rev. B, 51, 2311(1995).
29. L.Brügemann, R.Bloch, W.Press, and M.Tolan, Acta Crystallogr, Sect. A: Found. Crystallogr, A48, 688(1992).
30. S.Saito and A.Oshiyama, Phys. Rev. Lett, 66, 2637(1991).
31. Y.Yoneda, K.Sakaue, and H.Terauchi, J. Phys. Soc. Jpn, 63, 3560(1994).
32. L.Akselrod, H.J.Byrne, T.E.Sutto, and S.Roth, Chem. Phys. Lett, 233, 436(1995).
33. I.Belaish, I.Entin, R.Goffer, D.Davidov, H.Selig, J. P.McCauley, N.Coustel, J. E.Fischer, and A. B.Smith, J. Appl. Phys, 71, 5248(1992).
34. J.Hoschek and K.Klemm, Z. Anorg. Allg. Chem, 242, 49(1939).
35. V.Holý, U.Pietsch, and T. Baumbach, in X-Ray Scattering from Thin Films, Springer Tracts in Modern Physics Vol. 149 (Springer, Berlin, 1998).