Coherent x-ray diffraction imaging of silicon oxide growth

Physical Review B - Condensed Matter and Materials Physics

Volumn 60, Issue 14, 1999, Pages 9965-9972

  Robinson, I K ^a   Libbert, J L ^a   Vartanyants, I A ^a,b   Pitney, J A ^a   Smilgies, D M ^c   Abernathy, D L ^c   Grubel G ^c  

^a United States of America   (United States)

^b SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY   (Russian Federation)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000381216     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.60.9965     Document Type: Article

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