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Physica B: Condensed Matter

Volumn 248, Issue 1-4, 1998, Pages 387-394

Surface morphology by reflectivity of coherent X-rays

(4) Robinson, I K a Pitney, J A a Libbert, J L a Vartanyants, I A a,b

a University of Illinois at Urbana Champaign (United States)

b SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY (Russian Federation)

Author keywords

Coherent X ray diffraction; Morphology; Reflectivity

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; FOURIER TRANSFORMS; MORPHOLOGY; SYNCHROTRONS;

X RAY UNDULATORS; X RAY WIGGLERS;

X RAY DIFFRACTION ANALYSIS;

EID: 0032089583 PISSN: 09214526 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-4526(98)00357-3 Document Type: Article

Times cited : (12)

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