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Physical Review B - Condensed Matter and Materials Physics

Volumn 56, Issue 11, 1997, Pages 6454-6457

Speckle in coherent x-ray reflectivity from Si(111) wafers

(2) Libbert, J a Pindak, R b

a United States of America (United States)

b LUCENT TECHNOLOGIES (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005189203 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.56.6454 Document Type: Article

Times cited : (27)

References (14)

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