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Applied Physics Letters
Volumn 57, Issue 20, 1990, Pages 2089-2091
Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscope
Author keywords

[No Author keywords available]
Indexed keywords

EID: 21544451468     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.103950     Document Type: Article
Times cited : (500)
References (8)
  • 3
    • 84950549932 scopus 로고    scopus 로고
    • addition, lateral bending of the cantilever, in the x‐y plane, may occur. However, when currently available microfabricated cantilevers are used, no orientational change in the direction of the reflected laser beam is to be expected. Nevertheless, with the proper cantilever design, lateral bending can be detected with the optical beam deflection approach.
  • 4
    • 84950549937 scopus 로고    scopus 로고
    • Newbury Park, CA 0. 9132
  • 7
    • 84950549928 scopus 로고    scopus 로고
    • The absolute values of the measured forces depend critically on the tip length. Since the exact tip length was not measured after scanning, the values reported here have an estimated uncertainty of a factor of 2.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.