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Volumn 74, Issue 1, 1993, Pages 1-9
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Theoretical analysis of the static deflection of plates for atomic force microscope applications
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 36449006239
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.354137 Document Type: Article |
Times cited : (120)
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References (0)
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