High-resolution analytical transmission electron microscopy of semiconductor quantum structures

Fresenius' Journal of Analytical Chemistry

Volumn 365, Issue 1-3, 1999, Pages 217-220

  Schneider, R ^a   Kirmse, H ^a   Hahnert I ^a   Neumann, W ^a  

^a HUMBOLDT UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000356116     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160051476     Document Type: Article

References (10)

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