Photoemission assignments of HxSiO4-x fragments at the Si/SiOx interface

Applied Physics Letters

Volumn 68, Issue 8, 1996, Pages 1081-1083

  Lee, Sunghee ^a   Banaszak Holl, Mark M ^a   Hung, Wei Hsiu ^b   McFeely, F R ^b  

^a BROWN UNIVERSITY   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000355943     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115719     Document Type: Article

References (13)

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11. See Ref. 9 (b) and references therein.
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