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Volumn 71, Issue 15, 1993, Pages 2441-2444
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Si/SiO2 interface: New structures and well-defined model systems
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 4243766361
PISSN: 00319007
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevLett.71.2441 Document Type: Article |
Times cited : (106)
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References (13)
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