Effects o Xf the defect structure on hydrogen transport in amorphous silicon

Journal of Applied Physics

Volumn 82, Issue 6, 1997, Pages 2862-2868

  Acco, S ^a   Beyer, W ^b   Van Faassen, E E ^a   Van Der Weg, W F ^a  

^a UTRECHT UNIVERSITY   (Netherlands)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000344687     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366118     Document Type: Article

References (25)

1. W. B. Jackson and J. Kakalios, Amorphous Silicon and Related Materials, edited by H. Fritzsche (World Scientific, Singapore, 1989), p. 247.
2. P. V. Santos, N. M. Johnson, and R. A. Street, Phys. Rev. Lett. 67, 2686 (1991).
3. P. Hari, P. C. Taylor, and R. A. Street, Mater. Res. Soc. Symp. Proc. 377, 185 (1995).
4. W. Beyer and H. Wagner, J. Appl. Phys. 53, 8745 (1982).
5. W. B. Jackson, N. H. Nickel, N. M. Johnson, F. Pardo, and P. V. Santos, Mater. Res. Soc. Symp. Proc. 336, 311 (1994).
6. D. E. Carlson and C. W. Magee, Appl. Phys. Lett. 33, 81 (1978).
7. W. Beyer, Physica B 70, 105 (1991).
8. S. Roorda, W. C. Sinke, J. M. Poate, D. C. Jacobson, S. Dierker, B. S. Dennis, D. J. Eaglesham, F. Spaepen, and P. Fuoss, Phys. Rev. B 44, 3702 (1991).
9. P. A. Stolk, F. W. Saris, A. J. M. Berntsen, W. F. van der Weg, L. T. Sealy, R. C. Barklie, G. Krötz, and G. Müller, J. Appl. Phys. 75, 7266 (1994).
10. D. L. Williamson, S. Roorda, M. Chicoine, R. Tabti, P. A. Stolk, S. Acco, and F. W. Saris, Appl. Phys. Lett. 67, 226 (1995).
11. S. Acco, D. L. Williamson, P. A. Stolk, M. J. van der Boogaard, W. C. Sinke, W. F. van der Weg, S. Roorda, and P. C. Zalm, Phys. Rev. B 53, 4415 (1996).
12. K. Jones, D. L. Williamson, S. Acco, and M. M. Al-Jassim, Proceedings Microscopy and Microanalysis, edited by G. W. Bailey (San Francisco Press, San Francisco, 1996), p. 972.
13. W. Beyer, J. Non-Cryst. Solids 198-200, 40 (1996); Phys. Status Solidi A 159, 53 (1997).
14. W. Beyer, J. Non-Cryst. Solids 198-200, 40 (1996); Phys. Status Solidi A 159, 53 (1997).
15. W. Beyer and H. Wagner, Mater. Res. Soc. Symp. Proc. 336, 323 (1994); W. Beyer and U. Zastrow, ibid. 420, 497 (1996).
16. W. Beyer and H. Wagner, Mater. Res. Soc. Symp. Proc. 336, 323 (1994); W. Beyer and U. Zastrow, ibid. 420, 497 (1996).
17. W. B. Jackson and C. C. Tsai, Phys. Rev. B 45, 6564 (1992).
18. H. S. Carslaw and J. C. Jaeger, in Conduction of Heat in Solids (Oxford University Press, Oxford, 1959).
19. M. Kemp and H. M. Branz, Phys. Rev. B 52, 13946 (1995).
20. R. A. Street, Phys. Rev. B 43, 2454 (1991).
21. P. C. Taylor, W. D. Ohlsen, C. Lee, and E. D. van der Heiden, in Hydrogen in Disordered and Amorphous Solids, edited by G. Bambakidis and R. C. Bowman (Plenum, New York, 1986), p. 91.
22. H. J. Stein, Phys. Rev. Lett. 43, 1030 (1979).
23. Y. Hiroyama, T. Motooka, R. Suzuki, Y. Hirano, and F. Sato, Appl. Phys. Lett. 68, 3127 (1996).
24. The situation may be in reality more complex than described here. Previous work has suggested that during annealing small H complexes may disappear, and larger complexes grow at the expense of the smaller ones.
25. I. An, Y. M. Li, C. R. Wronsky, and R. W. Collins, Phys. Rev. B 48, 4464 (1993).