Characterization of interfacial roughness in Co/Cu multilayers by x-ray scattering

Physical Review B - Condensed Matter and Materials Physics

Volumn 56, Issue 11, 1997, Pages 6474-6477

  Gu, T ^a   Goldman, A ^a   Mao, M ^b  

^a IOWA STATE UNIVERSITY   (United States)

^b MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000326320     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.56.6474     Document Type: Article

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