Surface transmission electron microscopy on structures with truncation

Surface Review and Letters

Volumn 4, Issue 4, 1997, Pages 687-694

  Takayanagi, Kunio ^a   Naitoh, Yoshitaka ^a   Oshima, Yoshifumi ^a   Mitome, Masanori ^b  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0031315756     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X97000687     Document Type: Review

References (24)

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16. The reflection condition used for the image in Fig. 2 is intentionally deviated from the forbidden condition so that It(hkl) increases strongly enough for imaging with an exposure time of a few seconds at a magnification of x 50,000.
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