Atomic structure of steps on Si(113) surfaces studied by direct HRTEM observation

Surface and Interface Analysis

Volumn 30, Issue 1, 2000, Pages 288-291

  Takeguchi, Masaki ^a   Wu, Yuan ^a   Furuya, Kazuo ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; HIGH RESOLUTION ELECTRON MICROSCOPY; SURFACE STRUCTURE; TRANSMISSION ELECTRON MICROSCOPY;

ULTRAHIGH VACUUM FIELD EMISSION TRANSMISSION ELECTRON MICROSCOPY;

SILICON;

EID: 0034244849     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/1096-9918(200008)30:1<288::AID-SIA786>3.0.CO;2-R     Document Type: Article

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