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Volumn 54, Issue 7, 1996, Pages 4500-4503
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Scanning-tunneling-microscopy observation of stress-driven surface diffusion due to localized strain fields of misfit dislocations in heteroepitaxy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0007801511
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.54.4500 Document Type: Article |
Times cited : (19)
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References (22)
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