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Volumn 54, Issue 7, 1996, Pages 4500-4503

Scanning-tunneling-microscopy observation of stress-driven surface diffusion due to localized strain fields of misfit dislocations in heteroepitaxy

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Indexed keywords


EID: 0007801511     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.54.4500     Document Type: Article
Times cited : (19)

References (22)
  • 13
    • 85037906803 scopus 로고
    • X. C. Zhou et. al in Common Themes and Mechanisms of Epitaxial Growth, edited by P. Fuoss, J. Tsao, D. W. Kisker, A. Zangwill, and T. F. Kuech, MRS Symposia Proceeding No. 312 (Materials Research Society, Pittsburgh, 1993), p. 77.
    • (1993) Common Themes and Mechanisms of Epitaxial Growth , pp. 77
    • Zhou, X.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.