Simple views on metal/oxide interfaces: Contributions of the long-range interactions to the adhesion energy

Journal of Adhesion

Volumn 58, Issue 3-4, 1996, Pages 253-261

  Didier, Fabrice ^a   Jupille, Jacques ^a  

^a CNRS   (France)

Author keywords

Band gap; Conduction electron density; Dielectric constant; Image interaction; Metal oxide interface; Short range interaction; Van der waals interaction; Work of adhesion

Indexed keywords

CARRIER CONCENTRATION; CHARGE TRANSFER; ENERGY GAP; INTERFACES (MATERIALS); METALS; OXIDES; PERMITTIVITY;

IMAGE INTERACTION; SHORT RANGE INTERACTION; VAN DER WAALS INTERACTION; WORK OF ADHESION;

ADHESION;

EID: 0030373530     PISSN: 00218464     EISSN: None     Source Type: Journal    
DOI: 10.1080/00218469608015204     Document Type: Article

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