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Volumn 7, Issue 4, 1997, Pages 269-277

Effects of underfill encapsulant on the mechanical and electrical performance of a functional flip chip device

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000170102     PISSN: 09603131     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0960313197000282     Document Type: Article
Times cited : (13)

References (24)
  • 3
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    • Thermal fatigue life prediction of flip chip solder joints by fracture mechanics method
    • J. H. Lau, "Thermal fatigue life prediction of flip chip solder joints by fracture mechanics method", Int. J. Engrg. Fract. Mech. 45 (1993), 643-654.
    • (1993) Int. J. Engrg. Fract. Mech. , vol.45 , pp. 643-654
    • Lau, J.H.1
  • 4
    • 8744297380 scopus 로고
    • Thermomechanical characterization of flip chip solder bumps for multichip module applications
    • J. H. Lau, "Thermomechanical characterization of flip chip solder bumps for multichip module applications", Proc. IEEE International Electronics Manufacturing Technology Symposium (1992), pp. 293-299.
    • (1992) Proc. IEEE International Electronics Manufacturing Technology Symposium , pp. 293-299
    • Lau, J.H.1
  • 10
    • 0031276349 scopus 로고    scopus 로고
    • Analysis of the flow of encapsulant during underfill encapsulation of flipchips
    • IEEE Transactions on CPMT, Part B
    • S. Han and K. K. Wang, "Analysis of the flow of encapsulant during underfill encapsulation of flipchips", IEEE Transactions on CPMT, Part B, Advanced Packaging 20(4) (1997), 424-433.
    • (1997) Advanced Packaging , vol.20 , Issue.4 , pp. 424-433
    • Han, S.1    Wang, K.K.2
  • 11
    • 0031268605 scopus 로고    scopus 로고
    • Study on the pressurized underfill encapsulation of flip-chips
    • IEEE Transactions on CPMT, Part B
    • S. Han and K. K. Wang, "Study on the pressurized underfill encapsulation of flip-chips", IEEE Transactions on CPMT, Part B, Advanced Packaging 20(4) (1997), 434-442.
    • (1997) Advanced Packaging , vol.20 , Issue.4 , pp. 434-442
    • Han, S.1    Wang, K.K.2
  • 12
    • 0029699623 scopus 로고    scopus 로고
    • Advances in flip-chip underfill flow and cure rates and their enhancement of manufacturing processes and component reliability
    • D. M. Shi and J. W. Carbin, "Advances in flip-chip underfill flow and cure rates and their enhancement of manufacturing processes and component reliability", Proc. IEEE Electronic Components & Technology Conference (1996), pp. 1025-1031.
    • (1996) Proc. IEEE Electronic Components & Technology Conference , pp. 1025-1031
    • Shi, D.M.1    Carbin, J.W.2
  • 17
    • 0027067244 scopus 로고
    • Thermal fatigue life prediction of encapsulated flip chip solder joints for surface laminar circuit packaging
    • J. H. Lau, "Thermal fatigue life prediction of encapsulated flip chip solder joints for surface laminar circuit packaging", ASME Paper No. 92W/EEP-34, ASME Winter Annual Meeting, 1992.
    • (1992) ASME Paper No. 92W/EEP-34, ASME Winter Annual Meeting
    • Lau, J.H.1
  • 18
    • 0029277388 scopus 로고
    • Design and procurement of eutectic Sn/Pb solder-bumped flip chip test die and organic substrates
    • J. H. Lau, M. Heydinger, J. Glazer and D. Uno, "Design and procurement of eutectic Sn/Pb solder-bumped flip chip test die and organic substrates", Circuit World 21 (1995), 20-24.
    • (1995) Circuit World , vol.21 , pp. 20-24
    • Lau, J.H.1    Heydinger, M.2    Glazer, J.3    Uno, D.4
  • 19
    • 0029275313 scopus 로고
    • Characterization and evaluation of the underfill encapsulants for flip chip assembly
    • W. Wun, and J. H. Lau, "Characterization and evaluation of the underfill encapsulants for flip chip assembly", Circuit World 21 (1995), 25-32.
    • (1995) Circuit World , vol.21 , pp. 25-32
    • Wun, W.1    Lau, J.H.2
  • 20
    • 0029346780 scopus 로고
    • Low cost solder bumped flip chip MCM-L demonstration
    • M. Kelly and J. H. Lau, "Low cost solder bumped flip chip MCM-L demonstration", Circuit World 21 (1995), 14-17.
    • (1995) Circuit World , vol.21 , pp. 14-17
    • Kelly, M.1    Lau, J.H.2
  • 21
    • 0027569172 scopus 로고
    • Experimental and analytical studies of encapsulated flip chip solder bumps on surface laminar circuit boards
    • J. H. Lau, T. Krulevitch, W. Schar, M. Heydinger, S. Erasmus, and J. Gleason, "Experimental and analytical studies of encapsulated flip chip solder bumps on surface laminar circuit boards", Circuit World 19(3) (1993), 18-24.
    • (1993) Circuit World , vol.19 , Issue.3 , pp. 18-24
    • Lau, J.H.1    Krulevitch, T.2    Schar, W.3    Heydinger, M.4    Erasmus, S.5    Gleason, J.6
  • 22
    • 0030291758 scopus 로고    scopus 로고
    • Solder joint reliability of flip chip and plastic ball grid array assemblies under thermal, mechanical, and vibration conditions
    • J. H. Lau, "Solder joint reliability of flip chip and plastic ball grid array assemblies under thermal, mechanical, and vibration conditions", IEEE Transcations on CPMT, Part B, 19(4) (1996), 728-735.
    • (1996) IEEE Transcations on CPMT, Part B , vol.19 , Issue.4 , pp. 728-735
    • Lau, J.H.1
  • 23
    • 0030165108 scopus 로고    scopus 로고
    • Shock and vibration of solder bumped flip chip on organic coated copper boards
    • J. H. Lau, E. Schneider and T. Baker, "Shock and vibration of solder bumped flip chip on organic coated copper boards", ASME Transactions, J. Elect. Packaging (1996), 101-104.
    • (1996) ASME Transactions, J. Elect. Packaging , pp. 101-104
    • Lau, J.H.1    Schneider, E.2    Baker, T.3
  • 24
    • 0001926866 scopus 로고    scopus 로고
    • Flip chip assembly using the gold, gold-tin and nickel-gold metallurgy
    • ed. J. H. Lau, McGraw-Hill, New York, NY
    • E. Zakel and H. Reichl, "Flip chip assembly using the gold, gold-tin and nickel-gold metallurgy", in Flip Chip Technologies, ed. J. H. Lau, McGraw-Hill, New York, NY, 1996, pp. 415-490.
    • (1996) Flip Chip Technologies , pp. 415-490
    • Zakel, E.1    Reichl, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.