메뉴 건너뛰기




Volumn 20, Issue 4, 1997, Pages 434-442

Study on the pressurized underfill encapsulation of flip chips

Author keywords

Encapsulant; Flip chip; Pressurized encapsulation; Process development; Underfill; Void

Indexed keywords

ENCAPSULATION; PROCESS ENGINEERING; RELIABILITY; SOLDERED JOINTS;

EID: 0031268605     PISSN: 10709894     EISSN: None     Source Type: Journal    
DOI: 10.1109/96.641512     Document Type: Article
Times cited : (27)

References (19)
  • 2
    • 0000336248 scopus 로고
    • Controlled collapse reflow chip joining
    • L. F. Miller, "Controlled collapse reflow chip joining," IBM J. Res. Develop., vol. 13, pp. 239-250, 1969.
    • (1969) IBM J. Res. Develop. , vol.13 , pp. 239-250
    • Miller, L.F.1
  • 3
    • 0028125348 scopus 로고
    • Material and reliability considerations for anisotropically conductive adhesive based interconnects
    • Pittsburgh PA
    • J. Dion, P. Borgesen, B. Yost, D. A. Lilienfeld, and C. Y. Li, "Material and reliability considerations for anisotropically conductive adhesive based interconnects," in Proc. Mat. Res. Soc. Symp., Pittsburgh PA 1994.
    • (1994) Proc. Mat. Res. Soc. Symp.
    • Dion, J.1    Borgesen, P.2    Yost, B.3    Lilienfeld, D.A.4    Li, C.Y.5
  • 5
    • 0002567364 scopus 로고
    • Resin insertion effect on thermal cycle resistivity of flip-chip mounted LSI devices
    • F. Nakano, T. Soga, and S. Amagi, "Resin insertion effect on thermal cycle resistivity of flip-chip mounted LSI devices," in Proc. ISHM Conf., 1987, pp. 536-541.
    • (1987) Proc. ISHM Conf. , pp. 536-541
    • Nakano, F.1    Soga, T.2    Amagi, S.3
  • 10
  • 12
    • 33748830261 scopus 로고    scopus 로고
    • "Vacuum infiltration of underfill material for flip-chip devices," U.S. Patent 5 203 076, 1993
    • K. Banerji, "Vacuum infiltration of underfill material for flip-chip devices," U.S. Patent 5 203 076, 1993.
    • Banerji, K.1
  • 13
    • 33748840790 scopus 로고    scopus 로고
    • "Pressurized underfill encapsulation of integrated circuits," U.S. Patent pending, 1997
    • K. K. Wang and S. Han, "Pressurized underfill encapsulation of integrated circuits," U.S. Patent pending, 1997.
    • Wang, K.K.1    Han, S.2
  • 15
    • 0031276349 scopus 로고    scopus 로고
    • Analysis of the flow of encapsulant during underfill encapsulation of flip-chip
    • Nov.
    • S. Han and K. K. Wang, "Analysis of the flow of encapsulant during underfill encapsulation of flip-chip," IEEE Comp., Packag., Manufact. Technol., vol. 20, Nov., 1997.
    • (1997) IEEE Comp., Packag., Manufact. Technol. , vol.20
    • Han, S.1    Wang, K.K.2
  • 16
    • 36849101745 scopus 로고
    • Kinetics of wetting of surfaces by polymer melts
    • H. Schonhorn, H. L. Frisch, and T. K. Kwei, "Kinetics of wetting of surfaces by polymer melts," J. Appl. Phys., vol. 37, pp. 4967-4973, 1966.
    • (1966) J. Appl. Phys. , vol.37 , pp. 4967-4973
    • Schonhorn, H.1    Frisch, H.L.2    Kwei, T.K.3
  • 17
    • 0001090345 scopus 로고
    • Kinetics of wetting of surfaces by polymers; Capillary flow
    • S. Newman, "Kinetics of wetting of surfaces by polymers; Capillary flow," J. Colloid Interface Sci., vol. 26, pp. 209-213, 1968.
    • (1968) J. Colloid Interface Sci. , vol.26 , pp. 209-213
    • Newman, S.1
  • 18
    • 0027592569 scopus 로고
    • On the simulation of microelectronic encapsulation with epoxy molding compound
    • L. S. Turng and V. W. Wang, "On the simulation of microelectronic encapsulation with epoxy molding compound," J. Reinforced Plastics Composites, vol. 12, pp. 506-519, 1993.
    • (1993) J. Reinforced Plastics Composites , vol.12 , pp. 506-519
    • Turng, L.S.1    Wang, V.W.2
  • 19
    • 27144514723 scopus 로고
    • Konsistenzmessungen von GummiBenzollosungen
    • W. H. Herschel and R. Bulkley, "Konsistenzmessungen von GummiBenzollosungen," Kolloid Z., vol. 39, pp. 291-300, 1926.
    • (1926) Kolloid Z. , vol.39 , pp. 291-300
    • Herschel, W.H.1    Bulkley, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.