Annealing effects on secondary emission and charging of alumina ceramics

Proceedings of the International Conference on Electric Charge in Solid Insulators, CSC

Volumn , Issue , 1998, Pages 382-390

  Saito, Y ^a   Michizono, S ^a   Sato, T ^a   Kobayashi, S ^a   Jardin, C ^a  

^a HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ANNEALING; BAND STRUCTURE; CATHODOLUMINESCENCE; CERAMIC MATERIALS; CRYSTAL MICROSTRUCTURE; DISLOCATIONS (CRYSTALS); ELECTRIC BREAKDOWN OF SOLIDS; ELECTRON EMISSION; FLASHOVER; POINT DEFECTS; RESIDUAL STRESSES;

ELECTRON TRAPPING; OHMIC LOSSES; VACANCIES;

ELECTRIC INSULATING MATERIALS;

EID: 0031621887     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)