Role of interface roughness scattering in self-consistent resonant-tunneling-diode simulations

Physical Review B - Condensed Matter and Materials Physics

Volumn 58, Issue 11, 1998, Pages 7279-7285

  Klimeck, Gerhard ^a   Lake, Roger ^a   Blanks, Daniel K ^a  

^a RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000145174     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.58.7279     Document Type: Article

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