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Volumn 20, Issue 3, 1996, Pages 279-285
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Interface roughness, polar optical phonons, and the valley current of a resonant tunneling diode
a a a a a a b |
Author keywords
[No Author keywords available]
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Indexed keywords
CALCULATIONS;
COMPUTER SIMULATION;
CORRELATION METHODS;
ELECTRIC CURRENT MEASUREMENT;
ELECTRIC CURRENTS;
INTERFACES (MATERIALS);
LIGHT SCATTERING;
PHONONS;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SEMICONDUCTING GALLIUM ARSENIDE;
SURFACE ROUGHNESS;
INTERFACE ROUGHNESS;
OPTICAL PHONON SCATTERING;
POLAR OPTICAL PHONON;
RESONANT TUNNELING DIODE;
VALLEY CURRENT;
TUNNEL DIODES;
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EID: 0029766290
PISSN: 07496036
EISSN: None
Source Type: Journal
DOI: 10.1006/spmi.1996.0079 Document Type: Article |
Times cited : (31)
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References (17)
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