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Volumn , Issue , 1997, Pages 92-93
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Quantitative simulation of strained and unstrained InP-based resonant tunneling diodes
a a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER AIDED ANALYSIS;
COMPUTER AIDED DESIGN;
COMPUTER SIMULATION;
COMPUTER SOFTWARE;
CURRENT VOLTAGE CHARACTERISTICS;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SEMICONDUCTING INDIUM PHOSPHIDE;
SEMICONDUCTOR DEVICE MODELS;
THERMAL EFFECTS;
RESONANT TUNNELING DIODES (RTD);
SOFTWARE PACKAGE NEMO;
THERMIONIC EMISSION;
TUNNEL DIODES;
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EID: 0030650826
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (13)
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References (6)
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