Simultaneous measurements of the thermal optical and linear thermal expansion coefficients of a thin film etalon from the reflection spectra of a super-luminescent diode

Journal of Physics D: Applied Physics

Volumn 37, Issue 22, 2004, Pages 3151-3154

  Inci, M Nacil ^a  

^a SABANCI UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; OPTICAL FIBERS; OPTICAL MATERIALS; OPTOELECTRONIC DEVICES; PROTECTIVE COATINGS; REFRACTIVE INDEX; SEMICONDUCTOR DIODES; SPECTRUM ANALYSIS; STOICHIOMETRY; THIN FILMS;

OPTICAL COEFFICIENTS; REFLECTION SPECTRUM; SPECTRUM SHIFTS; SUPER-LUMINESCENT DIODE (SLD);

THERMAL EXPANSION;

EID: 9944258041     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/37/22/015     Document Type: Article

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