메뉴 건너뛰기




Volumn 13, Issue 4, 2004, Pages 612-622

Optimization of plasma etch processes using evolutionary search methods with in situ diagnostics

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; DISSOCIATION; ELECTROMAGNETIC WAVE EMISSION; OPTIMIZATION; PLASMAS; PRESSURE EFFECTS; SPECTRUM ANALYSIS;

EID: 9944251471     PISSN: 09630252     EISSN: None     Source Type: Journal    
DOI: 10.1088/0963-0252/13/4/010     Document Type: Article
Times cited : (16)

References (18)
  • 1
    • 0027913150 scopus 로고
    • Anisotropic etching of deep trench for silicon monolithic microwave integrated circuit
    • Lo T C and Huang H C 1993 Anisotropic etching of deep trench for silicon monolithic microwave integrated circuit Electron. Lett. 29 2202
    • (1993) Electron. Lett. , vol.29 , pp. 2202
    • Lo, T.C.1    Huang, H.C.2
  • 2
    • 21144472700 scopus 로고
    • Plasma-etching-an enabling technology for gigahertz silicon integrated circuits
    • Voshchenkov A M 1993 Plasma-etching-an enabling technology for gigahertz silicon integrated circuits J. Vac. Sci. Technol. A 11 1211
    • (1993) J. Vac. Sci. Technol. A , vol.11 , pp. 1211
    • Voshchenkov, A.M.1
  • 6
    • 0008055117 scopus 로고
    • + polycrystalline silicon with high selectivity using a chlorine and nitrogen plasma in an ultraclean electron cyclotron resonance etcher
    • + polycrystalline silicon with high selectivity using a chlorine and nitrogen plasma in an ultraclean electron cyclotron resonance etcher Appl. Phys. Lett. 57 569
    • (1990) Appl. Phys. Lett. , vol.57 , pp. 569
    • Uetake, H.1    Matsuura, T.2    Ohmi, T.3    Murota, J.4    Fukuda, K.5    Mikoshiba, N.6
  • 7
    • 0000992771 scopus 로고
    • Real-time monitoring of surface-chemistry during plasma processing
    • Aydil E S, Gotischo R A and Chabal Y J 1994 Real-time monitoring of surface-chemistry during plasma processing Pure Appl. Chem. 66 1381-8
    • (1994) Pure Appl. Chem. , vol.66 , pp. 1381-1388
    • Aydil, E.S.1    Gotischo, R.A.2    Chabal, Y.J.3
  • 8
    • 0032310181 scopus 로고    scopus 로고
    • Multi-channel process monitor for real-time film thickness and rate measurements in dry etching and deposition
    • Heinrich F, Heinze D, Kowalski T, Hoffmann P and Kopperschmidt P 1998 Multi-channel process monitor for real-time film thickness and rate measurements in dry etching and deposition Vacuum 51 497-502
    • (1998) Vacuum , vol.51 , pp. 497-502
    • Heinrich, F.1    Heinze, D.2    Kowalski, T.3    Hoffmann, P.4    Kopperschmidt, P.5
  • 9
    • 0033337701 scopus 로고    scopus 로고
    • Optimization of via formation in photosensitive dielectric layers using neural networks and genetic algorithm
    • Kim T S and May G 1999 Optimization of via formation in photosensitive dielectric layers using neural networks and genetic algorithm IEEE Trans. Electron. Packaging Manuf. 22 128
    • (1999) IEEE Trans. Electron. Packaging Manuf. , vol.22 , pp. 128
    • Kim, T.S.1    May, G.2
  • 12
    • 0000080651 scopus 로고    scopus 로고
    • Measurements of characteristic transients of planar electrostatic probes in cold plasmas
    • Booth J P, Braithwaite N St J, Goodyear A and Barroy P 2000 Measurements of characteristic transients of planar electrostatic probes in cold plasmas Rev. Sci. Instrum. 71 2722-7
    • (2000) Rev. Sci. Instrum. , vol.71 , pp. 2722-2727
    • Booth, J.P.1    Braithwaite, N.St.J.2    Goodyear, A.3    Barroy, P.4
  • 14
    • 0005696999 scopus 로고
    • Optical emission spectroscopy on the gaseous electronics conference RF reference cell
    • Roberts J R 1995 Optical emission spectroscopy on the gaseous electronics conference RF reference cell J. Res. Natl Inst. Stand. Technol. 100 353
    • (1995) J. Res. Natl Inst. Stand. Technol. , vol.100 , pp. 353
    • Roberts, J.R.1
  • 16
    • 0003853519 scopus 로고
    • Differential evolution - A simple and efficient adaptive scheme for global optimisation over continuous spaces
    • Storm R and Price K 1995 Differential evolution - a simple and efficient adaptive scheme for global optimisation over continuous spaces ICSI Technical Report TR-95-012
    • (1995) ICSI Technical Report , vol.TR-95-012
    • Storm, R.1    Price, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.