Very high resolution soft x-ray spectrometer for an electron beam ion trap

Review of Scientific Instruments

Volumn 68, Issue 1, 1997, Pages 1077-1079

  Beiersdorfer, P ^a   Crespo Lopez Urrutia J R ^a   Forster E ^b   Mahiri, J ^a,c   Widmann, K ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^c MOREHOUSE COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; DOPPLER EFFECT; ELECTRON BEAMS; ELECTRON TRANSITIONS; GERMANIUM; MAGNESIUM; OPTICAL RESOLVING POWER; PHOSPHATES; QUARTZ; TEMPERATURE MEASUREMENT;

AMMONIUM DIHYDROGEN PHOSPHATE; BRAGG ANGLES; ELECTRON BEAM ION TRAP; ION TEMPERATURE; VACUUM FLAT CRYSTAL SPECTROMETER;

X RAY SPECTROMETERS;

EID: 0030824485     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147791     Document Type: Article

References (9)

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