Escape depth of secondary electrons induced by ion Irradiation of submicron diamond membranes

Journal of Applied Physics

Volumn 96, Issue 10, 2004, Pages 5824-5829

  Richter, V ^a   Fizgeer, B ^a   Michaelson, Sh ^a   Hoffman, A ^a   Kalish, R ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; DIAMONDS; ELECTRIC EXCITATION; ELECTRON ENERGY LEVELS; MEMBRANES; PHOTONS; POLYCRYSTALLINE MATERIALS; SECONDARY EMISSION;

ELECTRON-PLASMON SCATTERING; ELECTRONIC ENERGY LOSS; SECONDARY ELECTRONS;

ION BOMBARDMENT;

EID: 9944219644     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1804225     Document Type: Article

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