Defect spectroscopy and determination of the electron diffusion length in single crystal diamond by total photoelectron yield spectroscopy

Physical Review Letters

Volumn 78, Issue 9, 1997, Pages 1803-1806

  Ristein, J ^a   Stein, W ^a   Ley, L ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CRYSTAL DEFECTS; ELECTRON EMISSION; EXCITONS; FERMI LEVEL; MATHEMATICAL MODELS; MONOCHROMATORS; SEMICONDUCTING DIAMONDS; SINGLE CRYSTALS; SURFACES;

CONDUCTION BAND; ELECTRON AFFINITY; ELECTRON DIFFUSION LENGTH; THERMALIZATION;

PHOTOELECTRON SPECTROSCOPY;

EID: 0031550751     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.78.1803     Document Type: Article

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