Subnanometric measurements of evanescent wave penetration depth using total internal reflection microscopy combined with fluorescent correlation spectroscopy

Applied Physics Letters

Volumn 85, Issue 17, 2004, Pages 3917-3919

  Harlepp, S ^a,b   Robert, J ^a,c   Darnton, N C ^a,c   Chatenay, D ^a  

^a UNIVERSITÉ DE STRASBOURG   (France)

^b UNIVERSITY OF CHICAGO   (United States)

^c HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EVANESCENT WAVES; FLUORESCENT CORRELATION SPECTROSCOPY (FCS); FORSTER RESONANCE ENERGY TRANSFER (FRET); TOTAL INTERNAL REFLECTION MICROSCOPY (TIRM);

CORRELATION METHODS; FLUORESCENCE; MATHEMATICAL MODELS; SIGNAL PROCESSING; SPECTROSCOPY; STATISTICAL METHODS; WAVELENGTH DISPERSIVE SPECTROSCOPY;

MICROSCOPIC EXAMINATION;

EID: 9744256952     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1802374     Document Type: Article

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