Polarized neutron reflectometry of a patterned magnetic film with a 3He analyzer and a position-sensitive detector

Review of Scientific Instruments

Volumn 75, Issue 10 I, 2004, Pages 3256-3263

  Chen, W C ^a   Gentile, T R ^a   O'Donovan, K V ^a   Borchers, J A ^a   Majkrzak, C F ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETIC FORCE MICROSCOPY; NEUTRON REFLECTROMETRY; PATTERNED MAGNETIC FILM; POSITIVE-SENSITIVE DETECTORS;

COBALT; DETECTORS; HELIUM; MIRRORS; NEUTRON DIFFRACTION; NEUTRON SCATTERING; POLARIZATION; SEMICONDUCTOR LASERS;

MAGNETIC THIN FILMS;

EID: 9744256271     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1791312     Document Type: Article

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