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Physical Review Letters

Volumn 88, Issue 6, 2002, Pages 67201/1-67201/4

Pinpointing chiral structures with front-back polarized neutron reflectometry

(5) O'Donovan, K V a Borchers, J A a Majkrzak, C F a Hellwig, O b Fullerton, E E b

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

b IBM ALMADEN RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; MAGNETIC MOMENTS; MAGNETIZATION; MAGNETRON SPUTTERING; MATHEMATICAL MODELS; NEUTRON REFLECTION; NEUTRON SCATTERING; NUCLEATION; REFLECTOMETERS; SCANNING ELECTRON MICROSCOPY; STRUCTURE (COMPOSITION);

CHIRAL STRUCTURES; FIELD DEPENDENT DOMAIN WALLS; MAGNETIC SYSTEMS; POLARIZED NEUTRON REFLECTOMETRY; SPIRAL SPIN STRUCTURES; THIN FILM EXCHANGE SPRING MAGNET;

MAGNETIC MATERIALS;

EID: 0037060280 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevLett.88.067201 Document Type: Article

Times cited : (81)

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