Low-temperature field emission system for development of ultracoherent electron beams

Review of Scientific Instruments

Volumn 75, Issue 10 I, 2004, Pages 3091-3096

  Cho, B ^a   Ogawa, T ^a   Ichimura, T ^a   Ichinokawa, T ^a   Amakusa, T ^b   Oshima, C ^a  

^a WASEDA UNIVERSITY   (Japan)

^b JEOL LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; CHARGE COUPLED DEVICES; COOLING; CRYOGENIC EQUIPMENT; CRYOSTATS; FIELD EMISSION DISPLAYS; HELIUM; MICROSCOPIC EXAMINATION; NANOTUBES; NITROGEN; RADIATION SHIELDING;

DIFFRACTION FRINGE PATTERNS; FIELD EMISSION (FE) SYSTEM; LIQUID HELIUM; LIQUID NITROGEN; PROJECTION MICROSCOPY;

ELECTRON BEAMS;

EID: 9744237313     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1790581     Document Type: Article

References (12)

1. L. Reimer, Transmission Electron Microscopy (Springer, Berlin, 1984).
2. A. Tonomura, Rev. Mod. Phys. 59, 639 (1987).
3. K. Nagaoka, T. Yamashita, S. Uchiyama, M. Yamada, H. Fuji, and C. Oshima, Nature (London) 396, 557 (1998).
4. C. Oshima, K. Mastuda, T. Kona, Y. Mogami, M. Komaki, Y. Murata, M. Yamashita, T. Kuzumaki and Y. Horiike, Phys. Rev. Lett. 88, 38301 (2002).
5. C. Oshima, Adv. Colloid Interface Sci. 71/72, 353 (1997).
6. M. Born and E. Wolf, Principles of Optics, 7th ed. (Cambridge University Press, New York, 1999).
7. V. T. Binh and V. Semet, Ultramicroscopy 73, 107 (1998).
8. JSTM4500XV, JEOL Ltd., http://www.jeol.co.jp.
9. Y. Saito, K. Hata, and T. Murata, Jpn. J. Appl. Phys., Part 2 39, L271 (2000).
10. V. T. Binh, P. Vincent, F. Feschet, and J. M. Bonard, J. Appl. Phys. 88, 3385 (2000).
11. V. T. Binh, S. T. Purcell, V. Semet, and F. Feschet, Appl. Phys. Lett. 72, 975 (1998).
12. J. Park, S. Kim, W. Park, and Y. Kuk, Appl. Phys. Lett. 78, 1745 (2001).