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Advances in Colloid and Interface Science

Volumn 71-72, Issue , 1997, Pages 353-369

An apparatus for high resolution field emission spectroscopy

(1) Oshima, Chuhei a

a WASEDA UNIVERSITY (Japan)

Author keywords

Coherent electron beam; Extremely high vacuum; Field emission spectroscopy; High resolution electron microscopy; Ionization pressure gauge

Indexed keywords

COMPUTER CONTROL; ELECTRON BEAMS; ELECTRON MICROSCOPY; NIOBIUM; PRESSURE GAGES; SPECTROMETERS; TUNGSTEN; VACUUM APPLICATIONS;

EXTREMELY HIGH VACUUM CHAMBER; HIGH RESOLUTION FIELD EMISSION SPECTROSCOPY;

EMISSION SPECTROSCOPY;

EID: 0031222167 PISSN: 00018686 EISSN: None Source Type: Journal
DOI: 10.1016/s0001-8686(97)00026-2 Document Type: Article

Times cited : (7)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.