Local analysis of the morphological properties of single-wall carbon nanotubes by Fresnel projection microscopy

Journal of Applied Physics

Volumn 88, Issue 6, 2000, Pages 3385-3391

  Binh, Vu Thien ^a   Vincent, P ^a   Feschet, F ^a   Bonard, J M ^b  

^a UNIVERSITÉ LYON 1   (France)

^b EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012924185     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1289786     Document Type: Article

References (32)

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